GRM21BR71A106KE51L Technical Specifications

Overview

The GRM21BR71A106KE51L is a Chip Monolithic Ceramic Capacitor designed for general electronic equipment. This document outlines its detailed specifications and test methods as of March 7, 2016.

Part Number Breakdown

• GRM: Manufacturer's Prefix (Murata)
• 21B: Size Code (Dimensions)
• R71: Temperature Characteristic (X7R, EIA Standard)
• A106: Capacitance Code (10uF)
• K: Tolerance (±10%)
• E51: Packaging Code

Dimensions

• Length (L): 2.0 mm ± 0.15 mm
• Width (W): 1.25 mm ± 0.15 mm
• Height (T): 0.2 mm to 0.7 mm

Rated Values

• Capacitance: 10 uF
• Rated Voltage: DC 10V
• Temperature Range: -55°C to +125°C
• Capacitance Tolerance: ±10%
• Temperature Coefficient: X7R (EIA Standard)

Packaging

• Reel Size:180 mm Reel (Embossed Tape, W8P4): 3000 pcs./Reel330 mm Reel (Embossed Tape, W8P4): 10000 pcs./Reel

Specifications and Test Methods

Rated Voltage

• Maximum continuous voltage: DC 10V
• AC voltage superimposed on DC voltage: Ensure VP-P or VO-P does not exceed rated voltage.

Appearance

• No defects or abnormalities. Visual inspection required.

Dimension

• Within specified dimensions. Calipers used for measurement (Microscope for GRM02 size).

Voltage Proof

• No defects or abnormalities.
• Test Voltage: 250% of rated voltage.
• Applied Time: 1 to 5 seconds.
• Charge/Discharge Current: 50mA max.

Insulation Resistance (I.R.)

• Minimum: 50Ω ∙ F
• Measurement Point: Between terminations.
• Measurement Voltage: DC Rated Voltage.
• Charging Time: 1 minute.
• Measurement Temperature: Room Temperature.
• Charge/Discharge Current: 50mA max.

Capacitance

• As specified in rated value.
• Measurement Temperature: Room Temperature.

Dissipation Factor (D.F.)

• Maximum values vary by part number:B1, R1, B3, R6, R7, C6, C7, C8, E7, D7: 0.1 max.D8: 0.15 max.GRM31CR71E106: 0.125 max.

Temperature Characteristics of Capacitance

• Capacitance change measured after 5 minutes at each specified temperature stage.
• Temperature ranges and allowable changes vary by part number:B1, R1, B3, R6, R7: Within ±15% (-55°C to +125°C)C6, C7, C8: Within ±22% (-55°C to +105°C)E7: Within +22/-56% (-55°C to +125°C)D7, D8: Within +22/-33% (-55°C to +105°C)

Adhesive Strength of Termination

• No removal of terminations or other defects.
• Solder the capacitor on the test substrate.
• Holding Time: 10±1 seconds.
• Applied Direction: Parallel with the test substrate and vertical with the capacitor side.

Vibration

• Appearance: No defects or abnormalities.
• Capacitance: Within specified initial value.
• D.F.: Within specified initial value.
• Vibration: Simple harmonic motion (10Hz to 55Hz to 10Hz, total amplitude 1.5mm, applied for 2 hours in each of 3 perpendicular directions, totaling 6 hours).

Substrate Bending Test

• Appearance: No defects or abnormalities.
• Capacitance Change: Within ±10%.
• Pressurization Method: As shown in Fig.2.
• Flexure: 1mm.
• Holding Time: 5±1 seconds.
• Soldering Method: Reflow soldering.

Solderability

• 95% of the terminations must be soldered evenly and continuously.
• Test Method: Solder bath method.
• Flux Solution: 25% rojin ethanol.
• Preheat: 80°C to 120°C for 10 to 30 seconds.
• Solder: Sn-3.0Ag-0.5Cu.
• Solder Temp: 245±5°C.
• Immersion Time: 2±0.5 seconds.

Resistance to Soldering Heat

• Appearance: No defects or abnormalities.
• Capacitance Change: Within specified limits (varies by part number).
• D.F.: Within specified initial value.
• Exposure Time: 24±2 hours.
• Initial measurement: Perform heat treatment at 150±10°C for 1 hour, then let sit for 24±2 hours at room temperature before measuring.

Temperature Sudden Change

• Appearance: No defects or abnormalities.
• Capacitance Change: Within specified limits (varies by part number).
• D.F.: Within specified initial value.
• I.R.: Within specified initial value.
• Exposure Time: 24±2 hours.
• Initial measurement: Perform heat treatment at 150±10°C for 1 hour, then let sit for 24±2 hours at room temperature before measuring.

High Temperature High Humidity (Steady)

• Appearance: No defects or abnormalities.
• Capacitance Change: Within ±12.5%.
• D.F.: Maximum 0.2.
• I.R.: More than 12.5Ω F.
• Exposure Time: 24±2 hours.
• Initial measurement: Perform heat treatment at 150±10°C for 1 hour, then let sit for 24±2 hours at room temperature before measuring.

Durability Test

• Appearance: No defects or abnormalities.
• Capacitance Change: Within ±12.5%.
• D.F.: Maximum 0.2.
• I.R.: More than 25Ω ∙ F.
• Exposure Time: 24±2 hours.
• Initial measurement: Perform heat treatment at 150±10°C for 1 hour, then let sit for 24±2 hours at room temperature before measuring.

Storage and Operation Conditions

• Store capacitors at room temperature (+5°C to +40°C) and relative humidity (20% to 70%).
• Avoid sunlight, dust, rapid temperature changes, corrosive gases, and high humidity.
• Use within six months to prevent oxidation of terminations.
• Confirm solderability before using after six months.
• Do not store in an atmosphere containing corrosive gases (e.g., hydrogen sulfide, sulfur dioxide, chlorine, ammonia).

Caution

• Applications: Contact Murata before using in applications requiring high reliability (e.g., aircraft, aerospace, medical equipment).
• Voltage: Do not exceed rated voltage. Consider AC voltage, pulse voltage, and surge voltage.
• Temperature Dependency: Capacitance may change with temperature. Select appropriate capacitance for operating temperature range.
• Measurement: Measure capacitance with specified voltage and frequency.
• Soldering: Follow recommended soldering conditions to prevent mechanical damage.
• Mounting: Choose mounting position to minimize stress during PCB flexing or bending.

Conclusion

The GRM21BR71A106KE51L is a reliable ceramic capacitor suitable for a wide range of electronic applications. Its detailed specifications and test methods ensure high performance and reliability. For further information or specific application requirements, please consult Murata's approval sheet or contact their technical support.