DESCRIPTION

· The SN54BCT8374A and SN74BCT8374A are scan test devices with octal edge-triggered D-type flip-flops.
· They are part of the Texas Instruments SCOPE testability integrated-circuit family.
· These devices support IEEE Standard 1149.1-1990 boundary scan for testing complex circuit-board assemblies.
· Scan access is achieved via a 4-wire test access port (TAP) interface.
· In normal mode, they are functionally equivalent to the 'F374 and 'BCT374 octal D-type flip-flops.
· The test circuitry can be activated by the TAP to sample data or perform self-tests on boundary-test cells.

FEATURES

· Compatible with IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture.
· Test operation is synchronous to the Test Access Port (TAP).
· Implements an optional test reset signal by recognizing a double-high-level voltage (10 V) on the TMS pin.
· Includes SCOPE Instruction Set with IEEE Standard 1149.1-1990 required instructions and optional INTEST, CLAMP, and HIGHZ.
· Supports parallel-signature analysis at inputs and pseudo-random pattern generation from outputs.
· Package options include Plastic Small-Outline (DW), Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs.

APPLICATIONS

· Facilitates testing of complex circuit-board assemblies through boundary-scan technology.
· Ideal for applications requiring high reliability and testability in digital systems.
· Suitable for use in environments where IEEE Standard 1149.1-1990 compliance is required.
· Can be used in systems that need to perform self-tests and data sampling without affecting normal operation.