ISSI, Integrated Silicon Solution Inc IS21EF08G-JCLI

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Specifications
Type
Paramete
Type
Paramete
Operating Temperature
-40°C ~ 85°C (TA)
Memory Format
FLASH
Package / Case
153-VFBGA
Memory Organization
8G x 8
Access Time
-
Memory Interface
eMMC_5.1
Technology
FLASH - NAND (MLC)
Memory Size
64Gbit
Mounting Type
Surface Mount
Clock Frequency
200 MHz
Memory Type
Non-Volatile
Supplier Device Package
153-VFBGA (11.5x13)
Grade
-
Qualification
-
Voltage - Supply
2.7V ~ 3.6V
Write Cycle Time - Word, Page
-
Overview

IS21EF08G‑JCLI Datasheet Summary


1. Basic Information


  • Part Number: IS21EF08G‑JCLI
  • Manufacturer: ISSI (Integrated Silicon Solution, Inc.)
  • Device Type: 8GB eMMC 5.1 Embedded Flash Memory
  • NAND Type: MLC NAND
  • Interface: eMMC 5.1 (backward compatible with v4.3/4.4/4.41/4.5/4.51/5.0)
  • Density: 8GB
  • Package: 153‑ball FBGA (11.5 mm × 13 mm × 1.0 mm)
  • Option: J‑Option (Boot Partition: 4096 KB each, RPMB: 4096 KB)
  • Temperature Grade: Industrial (I‑Grade)
  • Operating Temp Range: −40 °C to +85 °C
  • Green Compliance: RoHS‑compliant, halogen‑free, TSCA compliant
  • Revision: Rev. A8 (09/24/2025)

2. Key Features


  • eMMC 5.1 compliant; supports HS200 (up to 200 MB/s) and HS400 (up to 400 MB/s)
  • Clock frequency: 0–200 MHz; bus widths: 1‑bit (default), 4‑bit, 8‑bit
  • pSLC mode for improved performance, endurance, and reliability
  • Internal ECC, wear leveling, power‑failure protection, and safe data update
  • Security: secure bad block erase/trim, permanent/partial write protection
  • eMMC 5.1 features: HS400, FFU, Power Off Notification, Pre‑EOL info, RPMB enhancements
  • No CMD Queuing support

3. Power Supply


  • Core supply (VCC): 2.7 V – 3.6 V
  • I/O supply (VCCQ): 1.7 V – 1.95 V or 2.7 V – 3.6 V
  • VCCQ ≤ VCC required
  • Power-up time: 35 ms (3.3 V), 25 ms (1.8 V)

4. Performance Specifications


4.1 Sequential Burst Performance (8‑bit bus, VCC = 3.3 V, VCCQ = 1.8 V)

表格


ModeRead (MB/s)Write Cache On (MB/s)Write Cache Off (MB/s)
HS400225105100
HS20016010595
DDR52806565
SDR52454035

4.2 Random Burst Performance (IOPS)

表格


ModeReadWrite Cache OnWrite Cache Off
HS400520098001300
HS200530097002200

4.3 Power Consumption (Typical, TA = 25 °C)

表格


ModeOperationICC (mA)ICCQ (mA)
HS400Read45175
HS400Write4080
HS200Read40140
Standby40 μA130 μA
Sleep85 μA

5. Memory Layout (J‑Option)


  • User Density: 7,837,581,312 Bytes
  • Boot Partition 1: 4096 KB
  • Boot Partition 2: 4096 KB
  • RPMB (Replay Protected Memory Block): 4096 KB
  • Write Cache Size: 64 KB

6. Pin Interface Summary


  • CLK: Clock input
  • CMD: Command/response
  • DAT0–DAT7: 8‑bit bidirectional data bus
  • RST#: Hardware reset
  • DS: Data strobe (for HS400)
  • VCC: Core power
  • VCCQ: I/O power
  • VSS/VSSQ: Ground
  • VDDi: Internal regulator (bypass with 1–4.7 μF cap to GND)
  • RFU/NC: Reserved or no‑connect

7. Absolute Maximum Ratings


  • Voltage (VCC, VCCQ, inputs): −0.6 V to +4.6 V
  • ESD: per industry standard (not explicitly rated)
  • Storage temperature: −40 °C to +105 °C
  • Maximum case temperature (I‑grade): +95 °C

8. Key Functions


  • pSLC Mode: Reduces effective density but boosts reliability and speed
  • FFU: Field Firmware Update in‑system
  • Power Off Notification: Safe power‑down sequencing
  • Write Cache: Off by default; enabled via EXT_CSD
  • Cache Barrier: Ordered flushing control
  • PSA (Production State Awareness): Optimized pre‑/post‑soldering operation
  • Boot Support: Standard and alternative boot with high‑speed/DDR timing

9. Electrical & Timing Highlights


  • HS400: DDR at 200 MHz, data strobe synchronized
  • Clock duty cycle: 45–55%
  • Input setup/hold (HS400): 0.4 ns min
  • Signal slew rate: 1.125 V/ns
  • Bus load capacitance: ≤30 pF per line

10. Applications


  • Industrial embedded systems
  • Automotive (non‑A2) storage
  • IoT, gateways, industrial controllers
  • High‑reliability embedded storage


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