DESCRIPTION

· The SN54BCT8245A and SN74BCT8245A are scan test devices with octal bus transceivers, part of the Texas Instruments SCOPE™ testability IC family.

· These devices support IEEE Standard 1149.1-1990 boundary scan for testing complex circuit-board assemblies.

· In normal mode, they function equivalently to the 'F245 and 'BCT245 octal bus transceivers.

· Test circuitry is accessed via a 4-wire Test Access Port (TAP) interface, allowing snapshot data sampling and self-tests without affecting normal operation.

FEATURES

· Compatible with IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture.

· Test operation is synchronous to the TAP.

· Implements an optional test reset signal via a double-high-level voltage (10 V) on the TMS pin.

· Includes SCOPE™ instruction set with IEEE Standard 1149.1-1990 required instructions and optional INTEST, CLAMP, and HIGHZ.

· Supports parallel-signature analysis at inputs and pseudo-random pattern generation from outputs.

· Package options include plastic small-outline (DW), ceramic chip carriers (FK), and standard plastic and ceramic 300-mil DIPs (JT, NT).

APPLICATIONS

· Facilitates testing of complex circuit-board assemblies using boundary-scan technology.

· Suitable for applications requiring robust testability features in octal bus transceiver configurations.

· Ideal for systems where IEEE 1149.1-1990 compliance is necessary for test access and boundary-scan operations.