Sanyo FSS145-TL-E

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  • Part Number:

    FSS145-TL-E

  • Manufacturer:

    Sanyo

  • Category:

    Single, Pre-Biased Bipolar Transistors

  • RoHs:

    rohs Non-RoHS Compliant

  • Datasheet:

    pdf FSS145-TL-E_Datesheet

  • Description:

    FSS145 - P-CHANNEL SILICON MOSFE

  • In stock 3,000
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Specifications
Type
Paramete
Type
Paramete
Power Dissipation (Max)
-
Qualification
-
Vgs (Max)
-
FET Feature
-
FET Type
-
Mounting Type
-
Grade
-
Current - Continuous Drain (Id) @ 25°C
-
Operating Temperature
-
Vgs(th) (Max) @ Id
-
Rds On (Max) @ Id, Vgs
-
Supplier Device Package
-
Technology
-
Gate Charge (Qg) (Max) @ Vgs
-
Input Capacitance (Ciss) (Max) @ Vds
-
Drain to Source Voltage (Vdss)
-
Drive Voltage (Max Rds On, Min Rds On)
-
Package / Case
-
Overview


FSS145-TL-E Specification Summary


1. Product Overview

FSS145-TL-E is a P-channel silicon MOSFET manufactured by SANYO Semiconductors, designed as a general-purpose switching device. It features low on-resistance, 4V drive capability, and robust current handling, making it suitable for load switching applications. The device comes in an SOP8 package, with a part marking of "S145" for easy identification.


2. Key Features


  • Device Type: P-Channel Silicon MOSFET
  • Application: General-purpose load switching
  • Low ON-resistance: Down to 18 mΩ (typical) at ID=-8A, VGS=-10V
  • 4V drive compatibility: Operates with VGS=-4V
  • High current handling: DC drain current up to -8A; pulse current up to -32A (10µs, 1% duty cycle)
  • Wide voltage rating: Drain-to-source voltage (VDSS) of -45V
  • Compact package: SOP8
  • Marking Code: S145

3. Absolute Maximum Ratings (Ta=25°C)


ParameterSymbolConditionsRatingUnit
Drain-to-Source VoltageVDSS--45V
Gate-to-Source VoltageVGSS-+20V
DC Drain CurrentID--8A
Pulse Drain Current (PW=10s)IDDuty cycle=1%-8.5A
Pulse Drain Current (PW=10µs)IDPDuty cycle=1%-32A
Allowable Power DissipationPDMounted on ceramic board (1200mm²×0.8mm), PW=10s2.9W
Channel TemperatureTch-150°C
Storage TemperatureTstg--55 to +150°C

Note: Exceeding maximum ratings may cause permanent device damage. These are stress ratings only; functional operation beyond recommended conditions is not implied.


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