Texas Instruments(TI) LMG5200MOFT


- Part Number:
LMG5200MOFT
- Manufacturer:
- Category:
- RoHs:
RoHS Compliant
- Datasheet:
LMG5200MOFT_Datesheet
- Description:
IC HALF BRIDGE DRIVER 10A 9QFN
- In stock 1,092
LMG5200MOF Model Information
Model Overview
- Model Number: LMG5200MOF
- Package Type: QFM (9-Pin)
- Operating Temperature Range: -40°C to +125°C
- Storage Temperature Range: -40°C to +150°C
- Features
- Integrated GaN FETs and Driver: 15-mΩ GaN FETs with high-frequency driver
- Voltage Rating: 80-V continuous, 100-V pulsed
- Package Optimization: Designed for easy PCB layout, eliminating the need for underfill, creepage, and clearance requirements
- Low Common Source Inductance: Ensures high slew rate switching without excessive ringing
- Ideal for Isolated and Non-Isolated Applications: Suitable for a wide range of applications
- Gate Driver Capability: Up to 10 MHz switching
- Internal Bootstrap Supply Voltage Clamping: Prevents GaN FET overdrive
- Supply Rail Undervoltage Lockout Protection: Ensures safe operation
- Excellent Propagation Delay and Matching: 29.5 ns typical, 2 ns typical mismatch
- Low Power Consumption
- Applications
- Wide VIN Multi-MHz Synchronous Buck Converters: High-frequency power conversion
- Class D Amplifiers for Audio: High-efficiency audio amplification
- 48-V Point-of-Load (POL) Converters: For telecom, industrial, and enterprise computing
- High Power Density Single- and Three-Phase Motor Drive: Efficient motor control
- Pin Configuration
- PIN 1: VIN (Input Voltage)
- PIN 2: HB (High-side gate driver bootstrap rail)
- PIN 3: HS (High-side GaN FET source connection)
- PIN 4: HI (High-side gate driver control input)
- PIN 5: LI (Low-side driver control input)
- PIN 6: VCC (5-V positive gate drive supply)
- PIN 7: AGND (Analog ground)
- PIN 8: SW (Switching node)
- PIN 9: PGND (Power ground)
- Specifications
- Absolute Maximum Ratings:VIN to PGND: 0 to 80 VVIN to PGND (pulsed, 100-ms max duration): 100 VHB to AGND: -0.3 to 86 VHS to AGND: -5 to 80 VHI to AGND: -0.3 to 12 VLI to AGND: -0.3 to 12 VVCC to AGND: -0.3 to 6 VHB to HS: -0.3 to 6 VHB to VCC: 0 to 80 VSW to PGND: -5 to 80 VIOUT from SW pin: 10 AJunction Temperature (TJ): -40 to 125 °CStorage Temperature (Tstg): -40 to 150 °C
- ESD Ratings:Human-body model (HBM): ±1000 VCharged-device model (CDM): ±500 V
- Recommended Operating Conditions:VCC: 4.75 V to 5.25 VLI or HI Input: 0 to 12 VVIN: 0 to 80 VHS, SW: -5 to 80 VHB: VHS+ 4 V to VHS+ 5.25 VHS, SW Slew rate: 50 V/nsJunction Temperature (TJ): -40 to 125 °C
- Thermal Information:Junction-to-ambient thermal resistance (RθJA): 35 °C/WJunction-to-case (top) thermal resistance (RθJC(top)): 18 °C/WJunction-to-board thermal resistance (RθJB): 16 °C/WJunction-to-top characterization parameter (ψJT): 1.8 °C/WJunction-to-board characterization parameter (ψJB): 16 °C/W
- Electrical Characteristics:ICC (VCC Quiescent Current): 0.08 mA to 0.125 mAICCO (Total VCC Operating Current): 3.0 mA to 5.0 mAIHB (HB Quiescent Current): 0.09 mA to 0.150 mAIHBO (HB Operating Current): 1.5 mA to 2.5 mAVIH (High-Level Input Voltage Threshold): 1.87 V to 2.22 VVIL (Low-Level Input Voltage Threshold): 1.48 V to 1.76 VVHYS (Hysteresis between rising and falling threshold): 400 mVR (Input pull-down resistance): 100 kΩ to 300 kΩVCCR (VCC Rising edge threshold): 3.2 V to 4.5 VVCC(hyst) (VCC UVLO threshold hysteresis): 200 mVVHBR (HB Rising edge threshold): 2.5 V to 3.9 VVHB(hyst) (HB UVLO threshold hysteresis): 200 mVVDL (Low-Current forward voltage): 0.45 V to 0.65 VVDH (High current forward voltage): 0.9 V to 1.0 VRD (Dynamic Resistance): 1.85 Ω to 2.8 ΩHB-HS Clamp Regulation Voltage: 4.65 V to 5.2 VtBS (Bootstrap diode reverse recovery time): 40 nsQRR (Bootstrap diode reverse recovery charge): 2 nCRDS(ON)HS (High-side GaN FET on-resistance): 15 mΩ to 20 mΩRDS(ON)LS (Low-side GaN FET on-resistance): 15 mΩ to 20 mΩVSD (GaN 3rd quadrant conduction drop): 2 VIL-VIN-SW (Leakage from VIN to SW): 25 µA to 150 µAIL-SW-GND (Leakage from SW to GND): 25 µA to 150 µACOSS (Output Capacitance of high-side GaN FET and low-side GaN FET): 266 pFQG (Total Gate Charge): 3.8 nCQOSS (Output Charge): 21 nCQRR (Source to Drain Reverse Recovery Charge): 0 nCtHIPLH (Propagation delay: HI Rising): 29.5 ns to 50 nstHIPHL (Propagation delay: HI Falling): 29.5 ns to 50 nstLPLH (Propagation delay: LI Rising): 29.5 ns to 50 nstLPHL (Propagation delay: LI Falling): 29.5 ns to 50 nstMON (Delay Matching: LI high & HI low): 2 ns to 8.0 nstMOFF (Delay Matching: LI low & HI high): 2 ns to 8.0 nstPW (Minimum Input Pulse Width that Changes the Output): 10 ns
- Ordering Information
- Part Number: LMG5200MOFR
- Description: QFM package, 9 pins, RoHS & Green, MSL3, 2000 pieces per reel
- Part Number: LMG5200MOFT
- Description: QFM package, 9 pins, RoHS & Green, MSL3, 250 pieces per reel
- Mechanical Information
- Package Outline: QFM - 2 mm max height MOF0009A
- Dimensions: 6.00 mm × 8.00 mm × 2.00 mm
- Layout Guidelines
- Power Loop Optimization: Minimize power loop impedance by placing return path directly underneath the first layer.
- Capacitor Placement: Place VCC and bootstrap capacitors as close as possible to the device.
- AGND Connection: Do not directly connect AGND to PGND to avoid noise injection.
- SW Node Capacitance: Minimize capacitance by using minimal copper
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Texas Instruments(TI)

Texas Instruments(TI)

Texas Instruments(TI)

Texas Instruments(TI)

Texas Instruments(TI)

Texas Instruments(TI)

Texas Instruments(TI)

Texas Instruments(TI)

Texas Instruments(TI)

Texas Instruments(TI)

Texas Instruments(TI)

Texas Instruments(TI)