Micron Technology Inc. MT53E512M32D1ZW-046 AAT:B


- Part Number:
MT53E512M32D1ZW-046 AAT:B
- Manufacturer:
- Category:
- RoHs:
Non-RoHS Compliant - Datasheet:
- Description:
LPDDR4 16G 512MX32 FBGA
- In stock 1,379
Micron MT53E512M32D1ZW-046 AAT:B – LPDDR4X/LPDDR4 SDRAM Full Attachment Summary
1. Basic Identification
- Manufacturer: Micron Technology, Inc.
- Part Number: MT53E512M32D1ZW-046 AAT:B
- Device Type: LPDDR4X / LPDDR4 SDRAM (Embedded Mobile Low-Power DDR)
- Total Density: 16Gb (2GB)
- Organization: 512M × 32 (2 channels × 16 I/O per channel)
- Die Configuration: D1 = 1-die package
- Speed Grade: -046 → Data rate = 4266 Mb/s; tCK = 468 ps
- Voltage Grade: E = VDD1=1.80V, VDD2=1.10V, VDDQ=0.60V (LPDDR4X)
- Temperature Grade: AAT = Automotive Grade (−40°C to +105°C)
- Package: ZW = 200-ball TFBGA, 10mm × 14.5mm × 1.05mm, 0.40mm SMD
- Revision: :B = Second generation
- Compliance: RoHS, halogen‑free, JEDEC JESD209‑4, automotive qualified
2. Key Architecture & Features
- Max Bandwidth: Up to 8.5 GB/s per channel
- Prefetch: 16n‑bit DDR architecture
- Bank Structure: 8 banks per channel
- Burst Length: Programmable BL = 16 / 32
- Command Protocol: Single-data-rate (SDR) 2‑tick CA bus
- Data Bus: Double-data-rate (DDR) DQ with differential DQS
- Low Power Features:
- Reliability:
- I/O: LVSTL low‑swing signaling; programmable ODT & drive strength
3. Speed & Timing Parameters
- Data Rate: 4266 MT/s
- Clock Cycle: tCK = 468 ps
- Read Latency (RL):
- Write Latency (WL): 18
- Key Timings:
4. Memory Organization
- Channel: Dual‑channel (A + B), ×16 per channel
- Bank Groups: 1 group per channel; 8 banks total
- Row Address: A[15:0] (65,536 rows)
- Column Address: A[9:0]
- Page Size: 2048 bytes (2KB)
- Address Boundary: 64‑bit burst alignment
5. DC & Operating Conditions
Recommended Supply Voltages
- VDD1: 1.70–1.95V (typ 1.80V)
- VDD2: 1.06–1.17V (typ 1.10V)
- VDDQ (LPDDR4X): 0.57–0.65V (typ 0.60V)
- VDDQ (LPDDR4): 1.06–1.17V (typ 1.10V)
Temperature
- Operating (TA): −40°C to +105°C (AAT)
- Storage: −65°C to +150°C
Absolute Maximum Ratings
- VDD1/VDD2/VDDQ: −0.3V to 4.0V
- ESD (HBM): ±2000V
6. Package & Mechanical
- Package Code: ZW
- Type: 200‑ball TFBGA
- Dimensions: 10.0 mm × 14.5 mm × 1.05 mm
- Ball Pitch: 0.40 mm
- Solder: SACQ (Sn‑4Ag‑0.5Cu‑3Bi‑0.05Ni)
- Mounting: Surface‑mount
7. Signal Interface
- Differential clocks: CK_t/CK_c (per channel)
- Differential data strobes: DQS_t/DQS_c (per byte lane)
- Command/Address: CA[5:0] per channel
- Data: DQ[15:0] per channel (×32 total)
- Data mask/inversion: DMI[1:0] per channel
- Clock enable: CKE; Chip select: CS
- ZQ calibration pin; RESET_n; ODT_CA
8. Power Consumption (IDD) – Typical @ 4266 Mb/s
- Active (IDD0): VDD1=8.0mA, VDD2=58.0mA
- Standby (IDD2N): VDD1=2.4mA, VDD2=30.0mA
- Read (IDD4R): VDD1=15.0mA, VDD2=400.0mA, VDDQ=126.1mA
- Write (IDD4W): VDD1=15.0mA, VDD2=300.0mA
- Refresh (IDD5): VDD1=35.0mA, VDD2=190.0mA
- Self‑Refresh (IDD6 @ 85°C): VDD1=5.0mA, VDD2=12.0mA
9. Refresh Specifications
- Base Refresh Interval: tREFI = 7.8125 μs
- Temperature‑dependent:
- Per‑bank refresh support for concurrent operation
10. Key Mode Register Functions
- Burst length & latency configuration (MR0–MR3)
- Read/write preamble/postamble control (MR1)
- DBI enable/disable (MR3)
- ODT for CA & DQ buses (MR11, MR22)
- Internal VREF(CA) / VREF(DQ) calibration (MR12, MR14)
- PASR bank/segment masking (MR16, MR17)
- Frequency set point (FSP) switching (MR13)
- Target Row Refresh (TRR) control (MR24)
- PPR resource monitoring (MR25)
11. Initialization & Training
- Power-up voltage ramp: ≤ 20ms
- RESET_n hold: ≥ 200 μs
- Mandatory training:
- Mode register setup for high‑speed operation
12. Compliance & Quality
- Automotive grade (AAT)
- RoHS & halogen‑free
- JEDEC JESD209‑4 compliant
- Qualified for automotive embedded applications
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Micron Technology Inc.

Micron Technology Inc.
Micron Technology Inc.

Micron Technology Inc.

Micron Technology Inc.

Micron Technology Inc.

Micron Technology Inc.

Micron Technology Inc.

Micron Technology Inc.

Micron Technology Inc.

Micron Technology Inc.

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