Micron Technology Inc. MT53E512M32D1ZW-046 WT:B

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  • Part Number:

    MT53E512M32D1ZW-046 WT:B

  • Manufacturer:

    Micron Technology Inc.

  • Category:

    Display Drivers

  • RoHs:

    rohs Non-RoHS Compliant

  • Datasheet:

  • Description:

    IC DRAM 16GBIT 2.133GHZ 200WFBGA

  • In stock 864
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Specifications
Type
Paramete
Type
Paramete
Mounting Type
Surface Mount
Memory Type
Volatile
Voltage - Supply
1.06V ~ 1.17V
Memory Interface
Parallel
Write Cycle Time - Word, Page
18ns
Memory Format
DRAM
Package / Case
200-TFBGA
Grade
-
Qualification
-
Supplier Device Package
200-TFBGA (10x14.5)
Access Time
3.5 ns
Operating Temperature
-25°C ~ 85°C (TC)
Technology
SDRAM - Mobile LPDDR4
Memory Organization
512M x 32
Clock Frequency
2.133 GHz
Memory Size
16Gbit
Overview

Micron MT53E512M32D1ZW‑046 WT:B Full Specification Summary


1. Basic Device Information


  • Full Part Number: MT53E512M32D1ZW‑046 WT:B
  • Device Type: LPDDR4 / LPDDR4X SDRAM (unified LPDDR4/LPDDR4X)
  • Organization: 512M × 32‑bit (2 channels × 16 I/O)
  • Density: 16Gb (2GB)
  • Configuration: Single‑die, dual‑channel (D1)
  • Speed Grade: ‑046; tCK = 468 ps
  • Clock / Data Rate: 2133 MHz clock; 4266 Mbps per pin
  • Latency: RL = 36/40; WL = 18/34 (DBI Disabled/Enabled)
  • Package: 200‑ball TFBGA (ZW)
  • Dimensions: 10.0 mm × 14.5 mm × 1.05 mm
  • Temperature Grade: WT (–25 °C to +85 °C)
  • Special Option: B (alternate substrate)
  • Revision: B
  • Document: Rev. I (April 2023)
  • RoHS Compliant: Yes

2. Core Features


  • 16n prefetch DDR architecture
  • 8 internal banks per channel for concurrent operation
  • Single‑data‑rate (SDR) command/address (CA) bus
  • Differential bidirectional data strobe (DQS) per byte lane
  • Programmable READ/WRITE latencies (RL/WL)
  • Programmable burst lengths: BL = 16 / 32
  • Per‑bank refresh for efficient scheduling
  • On‑die temperature sensor for adaptive self‑refresh
  • Partial‑array self‑refresh (PASR)
  • Selectable output drive strength
  • Clock‑stop capability
  • Programmable on‑die termination (ODT)
  • Data Bus Inversion (DBI)
  • Write CRC & CA parity support
  • Post‑Package Repair (PPR)
  • Low‑power design optimized for mobile/embedded systems

3. Voltage Specifications


  • VDD1: 1.70 – 1.95 V (nominal 1.80 V)
  • VDD2: 1.06 – 1.17 V (nominal 1.10 V)
  • VDDQ (LPDDR4X): 0.57 – 0.65 V (nominal 0.60 V)
  • VDDQ (LPDDR4): 1.06 – 1.17 V (nominal 1.10 V)

4. Key Timing Parameters (‑046, 4266 Mbps)

表格


ParameterValue
Clock Cycle Time (tCK)468 ps
READ Latency (RL)36 (DBI off) / 40 (DBI on)
WRITE Latency (WL)18 (DBI off) / 34 (DBI on)
Bandwidth per DieUp to 8.5 GB/s (x16 channel)

5. Device Architecture


  • Channels: 2 channels (×16 I/O each)
  • Banks per channel: 8 banks
  • Row address: A[15:0] (64K rows)
  • Column address: A[9:0]
  • Page size: 2KB per bank
  • Prefetch: 256 bits per channel

6. Package & Mechanical


  • Package Code: ZW
  • Form Factor: 200‑ball TFBGA
  • Size: 10.0 × 14.5 × 1.05 mm
  • Ball pitch: 0.65 mm typical
  • Solder ball: Ø0.40 mm SMD
  • Mounting: Surface‑mount (SMT)
  • Moisture Sensitivity Level: MSL 3

7. Key Pin Groups


  • Differential clocks: CK_t / CK_c (per channel)
  • Command/Address: CA[5:0], CKE, CS
  • Data: DQ[15:0] per channel
  • Data strobe: DQS_t / DQS_c per byte lane
  • Data mask / inversion: DMI
  • Calibration: ZQ
  • Power: VDD1, VDD2, VDDQ, VSS
  • Reset: RESET_n

8. Power & Reliability


  • Low active & standby currents
  • Full‑array self‑refresh current as low as 0.65 mA (25 °C)
  • Power‑failure robust design
  • Hardware reset support
  • ESD protection: HBM > 2kV, CDM > 1kV

9. Operating Conditions


  • Ambient Temperature (TA): −25 °C to +85 °C
  • Supply voltages as specified in Section 3
  • Clock frequency: 10 MHz – 2133 MHz
  • JEDEC JESD209‑4 compliant

10. Target Applications


  • Smartphones, tablets, wearables
  • Mobile computing & portable electronics
  • Industrial embedded systems
  • Automotive infotainment (non‑safety)
  • High‑bandwidth, low‑power embedded designs


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